Instrument Name: Field Emission Electron Probe Microanalyzer

Model: JXA-iHP200F

Manufacturer: JEOL, Japan

Key Technical Specifications

1.Electron Optics

In-lens high-resolution Schottky field emission gun; equipped with secondary electron (SE) detector and backscattered electron (BSE) detector.

2.Sample Handling

Autoloading system for automated sample introduction; ZeroMag function for seamless optical-to-electron image transition.

3. Spectrometers

Five-channel wavelength-dispersive spectrometers (WDS) configured with L-type large crystals optimized for ultra-light elements, enabling trace analysis of Na, Mg, Al, Si, as well as B, C, and other light elements.

4. System Integration

Integrated SEM/EDS/WDS design.

5. Operation Software

EasyEPMA operation navigation system.

Application Scope

The JEOL JXA-iHP200F field emission electron probe microanalyzer performs high-spatial-resolution qualitative and quantitative elemental analysis covering B to U (excluding O). Capabilities include point analysis, line scanning, and elemental mapping, with detection limits down to tens of ppm. Simultaneous SE and BSE imaging enables morphological observation in parallel with compositional analysis.

Field Emission Electron Probe Microanalyzer